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Synthesis and characterization of anatase-TiO2 thin films

Author
SANKAPAL, B. R1 ; LUX-STEINER, M. Ch1 ; ENNAOUI, A1
[1] Department of Heterogeneous Material Systems, Division of Solar Energy Research, Hahn-Meitner-Institut. Glienicker Strasse 100, 14109 Berlin, Germany
Source

Applied surface science. 2005, Vol 239, Num 2, pp 165-170, 6 p ; ref : 24 ref

ISSN
0169-4332
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Characterization Synthesis Thin films Titanium dioxide
Keyword (fr)
Anatase Couche mince Diffraction RX Indice réfraction Microscopie force atomique Microscopie électronique balayage Microscopie électronique transmission Nanocristal Préparation Recuit Spectre RX Spectrométrie dispersive Structure surface Titane oxyde Composé minéral Métal transition composé O Ti TiO2
Keyword (en)
Anatase Thin films XRD Refractive index Atomic force microscopy Scanning electron microscopy Transmission electron microscopy Nanocrystal Preparation Annealing X-ray spectra Dispersive spectrometry Surface structure Titanium oxides
Keyword (es)
Anatasa Nanocristal Preparación Espectrometría dispersiva
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20C Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy

Pacs
6855J Structure and morphology; thickness

Pacs
7820C Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

Pacs
8115 Methods of deposition of films and coatings; film growth and epitaxy

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16558652

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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