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Annealing properties of ZnO films grown using diethyl zinc and tertiary butanol

Author
WANG, J. Z1 ; PERES, M1 ; SOARES, J1 ; GOROCHOV, O2 ; BARRADAS, N. P3 ; ALVES, E3 ; LEWIS, J. E4 ; FORTUNATO, E5 ; NEVES, A1 ; MONTEIRO, T1
[1] Department of Physics, Aveiro University, 3810-193 Aveiro, Portugal
[2] LPSC-CNRS, 1 Place Aristide Briand, 92195 Meudon, France
[3] Instituto Tecnológico e Nuclear, EN 10, 2685-953 Sacavém, Portugal
[4] Physics Department, Plattsburgh State University of New York, 101, Broad Street, Plattsburgh, NY 12901, United States
[5] Department of Materials Science/CENIMAT, Faculty of Sciences and Technology, New University of Lisbon, 2829-516 Caparica, Portugal
Source

Journal of physics. Condensed matter (Print). 2005, Vol 17, Num 10, pp 1719-1724, 6 p ; ref : 12 ref

CODEN
JCOMEL
ISSN
0953-8984
Scientific domain
Crystallography; Metallurgy, welding; Condensed state physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Composé minéral Couche mince Diffraction RX Diffusion Rutherford Mode vibration Métal transition composé Métal transition Méthode ERDA Méthode MOCVD Photoluminescence RBS Recuit Semiconducteur Spectre Raman Zinc oxyde 6322 6855J 7866L O Zn ZnO
Keyword (en)
Inorganic compounds Thin films XRD Rutherford scattering Vibrational modes Transition element compounds Transition elements Elastic recoil detection analysis method MOCVD Photoluminescence RBS Annealing Semiconductor materials Raman spectra Zinc oxides
Keyword (es)
Método ERDA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60C Lattice dynamics / 001B60C22 Phonons in low-dimensional structures and small particles

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66L Other semiconductors

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16583461

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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