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Dynamical direct methods for everyone

Author
SINKLER, W1 ; MARKS, L. D1
[1] Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208-3108, United States
Source

Ultramicroscopy. 1999, Vol 75, Num 4, pp 251-268 ; ref : 30 ref

CODEN
ULTRD6
ISSN
0304-3991
Scientific domain
Cell biology, histology; Crystallography; Physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Diffraction électron Etude expérimentale Haute résolution Méthode directe Structure cristalline TEM
Keyword (en)
Electron diffraction Experimental study High-resolution methods Direct method Crystal structure TEM
Keyword (es)
Método directo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16B Transmission, reflection and scanning electron microscopy(including ebic)

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A66 Structure of specific crystalline solids / 001B60A66F Inorganic compounds

Pacs
6166F Inorganic compounds

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1667620

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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