Study of the Mo thin films and Mo/CIGS interface properties
- Author
- ASSMANN, L1 ; BERNEDE, J. C1 ; DRICI, A1 ; AMORY, C1 ; HALGAND, E1 ; MORSLI, M1
[1] LPSE, Université de Nantes, 2 rue de la Houssinière, BP 92208, 44322 Nantes, France - Source
Applied surface science. 2005, Vol 246, Num 1-3, pp 159-166, 8 p ; ref : 23 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- 65.35.-p 68.55.jk 73.4.Cg Contact resistance Interface Molybdenum Sputtering Thin film
- Keyword (fr)
- Cellule solaire Chalcopyrite Composé ternaire Conductivité électrique Couche interfaciale Couche mince Cuivre séléniure Diffraction RX Indium séléniure Microscopie électronique balayage Molybdène Profil profondeur Propriété interface Pulvérisation irradiation Résistance contact Spectre photoélectron RX Structure interface Cu In Se CuInSe2 Mo Composé minéral Métal transition composé Métal transition
- Keyword (en)
- Solar cells Chalcopyrite Ternary compounds Electrical conductivity Interfacial layer Thin films Copper selenides XRD Indium selenides Scanning electron microscopy Molybdenum Depth profiles Interface properties Sputtering Contact resistance X-ray photoelectron spectra Interface structure Inorganic compounds Transition element compounds Transition elements
- Keyword (es)
- Capa interfacial Propiedad interfase
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35C Interface structure and roughness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C40 Electronic transport in interface structures / 001B70C40C Contact resistance, contact potential
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16768533
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.apsusc.2004.11.020 
https://dx.doi.org/10.1016/j.apsusc.2004.11.020
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