Use of chemically modified AFM tips as a powerful tool for the determination of surface energy of functionalised surfaces
- Autor
- AWADA, H1 ; CASTELEIN, G1 ; BROGLY, M1
[1] Institut de Chimie des Surfaces et Interfaces (ICSI) - UPR 9069, 15 rue Jean Starcky, 68057 Mulhouse, France - Titulo de la conferencia
- CSM4 : Quatrième colloque franco-libanais sur la science des matériaux, Beyrouth, Liban, 26-28 mai 2004
- Nombre de la conferencia
- CSM4 Colloque Franco-Libanais sur la Science des Matériaux (4 ; Beyrouth 2004-05-26)
- Autor ( monografía)
- HAMIEH, Tayssir (Editor)1
Université Libanaise (UL) ; Faculté des Sciences, Beyrouth, Lebanon (Funder/Sponsor)
Conseil National de la Recherche Scientifique du Liban (CNRSL), Lebanon (Funder/Sponsor)
Centre national de la recherche scientifique (CNRS) ; Institut de chimie des surfaces et interfaces (ICSI), 68057 Mulhouse, France (Funder/Sponsor)
Université de Haute-Alsace, Mulhouse, France (Funder/Sponsor)
Centre national de la recherche scientifique (CNRS), France (Funder/Sponsor)
[1] Laboratoire de Chimie Analytique, Matériaux, Surfaces et Interfaces (CHAMSI), Faculté des Sciences I, Université Libanaise, Hadeth, Beyrouth, Lebanon - Fuente
Journal de physique. IV. 2005, Vol 124, pp 129-134, 6 p ; ref : 17 ref
- Editor
- EDP sciences, Les Ulis
- País de la publicación
- France
- Tipo de documento
- Conference Paper
- Idioma
- English
- Palabra clave (fr)
- Adsorption Déflexion Energie surface Epaisseur Greffage Interaction pointe surface Microscopie force atomique Microscopie électronique balayage Méthode étude Rugosité 6837 Au Ti
- Palabra clave (in)
- Adsorption Deflection Surface energy Thickness Grafting Tip surface interactions Atomic force microscopy Scanning electron microscopy Investigation method Roughness
- Palabra clave (es)
- Injerto Método estudio
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 16785993
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1051/jp4:2005124020 
https://dx.doi.org/10.1051/jp4:2005124020
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