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Surface morphology of GaInP buffer layers and its impact on the lateral distribution of self-organized InP islands

Author
HAO WANG1 ; GUCHENG ZENG2 ; ZHIJUN SONG3 ; YANGZHE WU2 ; CHANGJUN LIAO1 ; XUEYI LE3 ; JIYE CAI2 ; SONGHAO LIU1
[1] School for Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510631, China
[2] Department of Chemistry, Jinan University, Guangzhou 510632, China
[3] College of Science, South China Agricultural University, Guangzhou 510642, China
Source

Journal of crystal growth. 2005, Vol 279, Num 3-4, pp 241-247, 7 p ; ref : 29 ref

CODEN
JCRGAE
ISSN
0022-0248
Scientific domain
Crystallography; Geology; Metallurgy, welding
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
42.55.Sa A1. CrystA1 structure 68.55.Ac 68.55.Nq 81.07.Ta 81.15.Gh 81.16.Dn A1. Stress A3. MetA1organic chemicA1 vapor deposition A3. Quantum dot B2. Semiconducting indium phosphide
Keyword (fr)
Autoorganisation Composé binaire Couche tampon Dislocation Effet contrainte Etude expérimentale Indium phosphure Microscopie force atomique Morphologie Orientation cristalline Semiconducteur III-V Structure îlot In P InP Substrat GaAs Composé minéral
Keyword (en)
Self organization Binary compounds Buffer layer Dislocations Stress effects Experimental study Indium phosphides Atomic force microscopy Morphology Crystal orientation III-V semiconductors Island structure Inorganic compounds
Keyword (es)
Autoorganización Capa tampón
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72L Linear defects: dislocations, disclinations

Pacs
6172L Linear defects: dislocations, disclinations

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16795304

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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