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Analysis on the effectiveness of the 20-H rule for printed-circuit-board layout to reduce edge-radiated coupling

Author
MONTROSE, Mark I1 ; LI, Er-Ping2 ; JIN, Hong-Fang2 ; YUAN, Wei-Liang2
[1] Montrose Compliance Services, Inc, Santa Clara, CA 95051-1214, United States
[2] Institute of High Performance Computing and the National University of Singapore, Singapore 117528, Singapore
Source

IEEE transactions on electromagnetic compatibility. 2005, Vol 47, Num 2, pp 227-233, 7 p ; ref : 8 ref

CODEN
IEMCAE
ISSN
0018-9375
Scientific domain
Electrical engineering; Physics; Telecommunications
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
20-H rule Finite-difference time-domain (FDTD) simulation printed circuit board (PCB)
Keyword (fr)
Carte électronique Couplage électromagnétique Méthode différence finie domaine temps Simulation Vecteur Poynting
Keyword (en)
Printed circuit board Electromagnetic coupling Finite difference time-domain analysis Simulation Poynting vector
Keyword (es)
Tarjeta electronica Acoplamiento electromagnético Simulación Vector Poynting
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D04 Telecommunications and information theory / 001D04A Information, signal and communications theory / 001D04A06 Electromagnetic compatibility

Discipline
Electronics Telecommunications and information theory
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16810403

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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