On some perfect codes with respect to Lee metric
- Author
- JAIN, Sapna1 ; NAM, Ki-Bong2 ; LEE, Ki-Suk3
[1] Department of Mathematics, Miranda House, University of Delhi, Delhi 110 007, India
[2] Department of Mathematics, University of Wisconsin-Whitewater, Whitewater, WI 53190, United States
[3] Department of Mathematics Education, Korea National University of Education, Choong-Book, Cheong-Won 363-791, Korea, Republic of - Source
Linear algebra and its applications. 2005, Vol 405, pp 104-120, 17 p ; ref : 12 ref
- CODEN
- LAAPAW
- ISSN
- 0024-3795
- Scientific domain
- Mathematics
- Publisher
- Elsevier Science, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- 94B05 Lee weight: Linear codes Perfect codes
- Keyword (fr)
- Code correcteur erreur Code linéaire Code parfait Métrique
- Keyword (en)
- Error correcting code Linear code Perfect code Metric
- Keyword (es)
- Código corrector error Código lineal Código perfecto Métrico
- Classification
- Pascal
- 001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics / 001A02C Algebra / 001A02C06 Linear and multilinear algebra, matrix theory
- Discipline
- Mathematics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16939373
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.laa.2005.03.001 
https://dx.doi.org/10.1016/j.laa.2005.03.001
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