Noise metrics in flip-flop designs
- Author
- ELGAMEL, Mohammed A1 ; FAISAL, Md Ibrahim1 ; BAYOUMI, Magdy A1
[1] Center for Advanced Computer Studies (CACS), University of Louisiana at Lafayette, P.O. Box 4330, Lafayette, LA 70504, United States - Source
IEICE transactions on information and systems. 2005, Vol 88, Num 7, pp 1501-1505, 5 p ; ref : 17 ref
- ISSN
- 0916-8532
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Oxford University Press, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- deep aubmicron flip-flop low power noise immunity
- Keyword (fr)
- Bruit Circuit VLSI Circuit bistable Conception circuit Puissance faible Simulation
- Keyword (en)
- Noise VLSI circuit Flip-flop circuits Circuit design Low power Simulation
- Keyword (es)
- Ruido Circuito VLSI Diseño circuito Potencia débil Simulación
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16958511
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1093/ietisy/e88-d.7.1501 
https://dx.doi.org/10.1093/ietisy/e88-d.7.1501
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