Diffraction analysis of a disordered surface, modelled on a probability distribution of reconstructed blocks : Bi/Si(001)-(2 x n), n = 6.45
- Author
- JEDRECY, N1 2 ; GAVIOLI, L3 ; MARIANI, C3 ; BETTI, M. G3 ; CROSET, B4 ; DE BEAUVAIS, C4
[1] LURE, CNRS-MRES-CEA, Bâtiment 209 D, Centre Universitaire Paris Sud, BP 34, 91898 Orsay, France
[2] Laboratoire de Minéralogie-Cristallographie, Associé au CNRS et aux Universités Paris 6 et Paris 7, Place Jussieu, 75252 Paris, France
[3] Dipartimento di Fisica, Università di Modena, via G Campi 213/A, 41100 Modena, Italy
[4] Groupe de Physique des Solides, UMR CNRS 75-88, 2 Place Jussieu, 7525 Paris, France - Source
Journal of physics. Condensed matter (Print). 1999, Vol 11, Num 8, pp 1935-1951 ; ref : 25 ref
- CODEN
- JCOMEL
- ISSN
- 0953-8984
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Bismuth Diffraction RX Etude expérimentale Etude théorique Incidence rasante Intensité intégrée Intensité raie Reconstruction surface Silicium Structure adsorption Structure surface Système désordonné Bi Si
- Keyword (en)
- Bismuth XRD Experimental study Theoretical study Grazing incidence Integrated intensity Line intensity Surface reconstruction Silicon Adsorption structure Surface structure Disordered systems
- Keyword (es)
- Incidencia rasante Intensidad integrada Estructura adsorción
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1696768
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0953-8984/11/8/007 
https://dx.doi.org/10.1088/0953-8984/11/8/007
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