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First-principles study on exchange force image of NiO(001) surface using a ferromagnetic Fe probe

Author
MOMIDA, Hiroyoshi1 ; OGUCHI, Tamio1
[1] Department of Quantum Matter, ADSM, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8530, Japan
Source

Surface science. 2005, Vol 590, Num 1, pp 42-50, 9 p ; ref : 31 ref

CODEN
SUSCAS
ISSN
0039-6028
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics; Polymers, paint and wood industries
Publisher
Elsevier Science, Amsterdam / Elsevier Science, Lausanne / Elsevier Science, New York, NY
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Atomic force microscopy Density functional calculations Magnetic surfaces Nickel oxides
Keyword (fr)
Composé minéral Fer Force image Microscopie force atomique Métal transition composé Méthode fonctionnelle densité Nickel oxyde Fe Ni O NiO
Keyword (en)
Inorganic compounds Iron Image force Atomic force microscopy Transition element compounds Density functional method Nickel oxides
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17007662

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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