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Fluence dependence of femtosecond-laser-induced nanostructure formed on TiN and CrN

Author
YASUMARU, N1 ; MIYAZAKI, K2 ; KIUCHI, J3
[1] Department of Mechanical Engineering, Fukui National College of Technology, Sabae, Fukui 916-8507, Japan
[2] Institute of Advanced Energy, Kyoto University, Uji, Kyoto 611-0011, Japan
[3] Eyetec Co.. Ltd, Sabae, Fukui 916-0016, Japan
Source

Applied physics. A, Materials science & processing (Print). 2005, Vol 81, Num 5, pp 933-937, 5 p ; ref : 12 ref

ISSN
0947-8396
Scientific domain
Electronics; Optics; Condensed state physics
Publisher
Springer, Berlin
Publication country
Germany
Document type
Article
Language
English
Keyword (fr)
Chrome nitrure Cratère Effet rayonnement Fluence Impulsion laser Microscopie électronique balayage Méthode ablation laser Nanostructure Ondulation Polarisation rectiligne Rayonnement laser Rayonnement polarisé Titane nitrure 7920D
Keyword (en)
Chromium nitrides Craters Radiation effects Fluence Laser pulse Scanning electron microscopy Laser ablation technique Nanostructures Ripples Linear polarization Laser radiation Polarized radiation Titanium nitrides
Keyword (es)
Fluencia Impulsión láser Radiación polarizada
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20D Laser-beam impact phenomena

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17043435

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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