Measurements of the atomistic mechanics of single crystalline silicon wires of nanometer width
- Author
- KIZUKA, Tokushi1 2 3 ; TAKATANI, Yasuhiro1 ; ASAKA, Koji3 ; YOSHIZAKI, Ryozo1 2
[1] Institute of Materials Science, University of Tsukuba, Tsukuba 305-8573, Japan
[2] Special Research Project of Nanoscience, University of Tsukuba, Tsukuba 305-8573, Japan
[3] Precursory Research for Embryonic Science and Technology, Japan Science and Technology Agency, Tsukuba 305-8573, Japan - Source
Physical review B. Condensed matter and materials physics. 2006, Vol 72, Num 3, pp 035333.1-035333.6 ; ref : 67 ref
- ISSN
- 1098-0121
- Scientific domain
- Metallurgy, welding; Condensed state physics
- Publisher
- American Physical Society, Ridge, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Essai traction Limite élasticité Microscopie électronique transmission Module Young Modèle atomistique Monocristal Nanostructure Rupture Résistance mécanique Silicium 6225 Si
- Keyword (en)
- Tensile tests Yield strength Transmission electron microscopy Young modulus Atomistic model Monocrystals Nanostructures Ruptures Mechanical strength Silicon
- Keyword (es)
- Modelo atomistico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60B Mechanical and acoustical properties of condensed matter / 001B60B25 Mechanical properties of nanoscale materials
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17075293
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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