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Measurements of the atomistic mechanics of single crystalline silicon wires of nanometer width

Author
KIZUKA, Tokushi1 2 3 ; TAKATANI, Yasuhiro1 ; ASAKA, Koji3 ; YOSHIZAKI, Ryozo1 2
[1] Institute of Materials Science, University of Tsukuba, Tsukuba 305-8573, Japan
[2] Special Research Project of Nanoscience, University of Tsukuba, Tsukuba 305-8573, Japan
[3] Precursory Research for Embryonic Science and Technology, Japan Science and Technology Agency, Tsukuba 305-8573, Japan
Source

Physical review B. Condensed matter and materials physics. 2006, Vol 72, Num 3, pp 035333.1-035333.6 ; ref : 67 ref

ISSN
1098-0121
Scientific domain
Metallurgy, welding; Condensed state physics
Publisher
American Physical Society, Ridge, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Essai traction Limite élasticité Microscopie électronique transmission Module Young Modèle atomistique Monocristal Nanostructure Rupture Résistance mécanique Silicium 6225 Si
Keyword (en)
Tensile tests Yield strength Transmission electron microscopy Young modulus Atomistic model Monocrystals Nanostructures Ruptures Mechanical strength Silicon
Keyword (es)
Modelo atomistico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60B Mechanical and acoustical properties of condensed matter / 001B60B25 Mechanical properties of nanoscale materials

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17075293

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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