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MBE growth of β-FeSi2 epitaxial film on hydrogen terminated Si (111) substrate

Author
JI, S. Y1 ; LALEV, G. M2 ; WANG, J. F1 ; LIM, J. W1 ; YOO, J. H1 ; SHINDO, D1 ; ISSHIKI, M1
[1] Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
[2] Manufacturing Enaineering Centre, Cardiff University, Queen's Building, Cardiff CF24 0YF, United Kingdom
Source

Journal of crystal growth. 2005, Vol 285, Num 1-2, pp 284-294, 11 p ; ref : 28 ref

CODEN
JCRGAE
ISSN
0022-0248
Scientific domain
Crystallography; Geology; Metallurgy, welding
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
68.55.-a 73.61.J Al. Reflective high-energy electron diffraction 81.15.H A3. Molecular beam epitaxy B2. Semiconducting silicon compounds
Keyword (fr)
Couche épitaxique Croissance film Diffraction RX Epaisseur Epitaxie jet moléculaire Fer siliciure Hydrogène 1 Microscopie électronique balayage Monocristal Mécanisme croissance Méthode SSMBE Recuit Silicium composé Substrat Température Si
Keyword (en)
Epitaxial layers Film growth XRD Thickness Molecular beam epitaxy Iron silicides Hydrogen 1 Scanning electron microscopy Monocrystals Growth mechanism Solid source molecular beam epitaxy Annealing Silicon compounds Substrates Temperature
Keyword (es)
Mecanismo crecimiento Método SSMBE
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A10 Methods of crystal growth; physics of crystal growth

Discipline
Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17213914

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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