Investigation of interface electronic structure of annealed Ti/Ni multilayers
- Author
- BHATT, Pramod1 ; CHAUDHARI, S. M1
[1] UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452017, MP, India - Source
Journal of physics. Condensed matter (Print). 2005, Vol 17, Num 48, pp 7465-7488, 24 p ; ref : 73 ref
- CODEN
- JCOMEL
- ISSN
- 0953-8984
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Bande valence Diffraction RX Energie liaison Etat électronique interface Evaporation faisceau électronique Multicouche Nickel Niveau coeur Profil profondeur Recuit Réaction interface Spectre photoélectron Titane Transfert charge 7321A
- Keyword (en)
- Valence bands XRD Binding energy Interface electron state Electron beam evaporation Multilayers Nickel Core levels Depth profiles Annealing Interface reaction Photoelectron spectra Titanium Charge transfer
- Keyword (es)
- Estado electrónico interfase Reacción interfase Transferencia carga
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C21 Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems / 001B70C21A Thin films and multilayers
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17297489
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0953-8984/17/48/002 
https://dx.doi.org/10.1088/0953-8984/17/48/002
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