Simplified model to predict the effect of the leakage current on primary and secondary current distributions in electrochemical reactors with a bipolar electrode
- Author
- HENQUIN, E. R1 ; BISANG, J. M1
[1] Programa de Electroquimica Aplicada e Ingeniería Electroquimica (PRELINE), Facultad de Ingeniería Química (UNL), Santiago del Estero 2829, S3000AOM Santa Fe, Argentina - Source
Journal of applied electrochemistry. 2005, Vol 35, Num 12, pp 1183-1190, 8 p ; ref : 15 ref
- CODEN
- JAELBJ
- ISSN
- 0021-891X
- Scientific domain
- General chemistry, physical chemistry; Electrical engineering; Metallurgy, welding
- Publisher
- Springer, Heidelberg
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Author keyword
- bipolar electrodes current distribution electrochemical reactors leakage current
- Keyword (fr)
- Courant fuite Distribution courant Electrode bipolaire Etude théorique Modèle mathématique Modélisation Prédiction Réacteur électrochimique
- Keyword (en)
- Leakage current Current distribution Bipolar electrode Theoretical study Mathematical model Modeling Prediction Electrochemical reactor
- Keyword (es)
- Corriente escape Distribución corriente Electrodo bipolar Estudio teórico Modelo matemático Modelización Predicción Reactor electroquímico
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01H Electrochemistry / 001C01H01 General
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17416701
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s10800-005-9029-3 
https://dx.doi.org/10.1007/s10800-005-9029-3
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