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Intermetallic reactions in Sn-8Zn-20In solder ball grid array packages with Au/Ni/Cu and Ag/Cu pads

Author
LIU, Yu-Chih1 ; LIN, Wei-Hong1 ; LIN, Hsiu-Jen1 ; CHUANG, Tung-Han1
[1] Institute of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan, Province of China
Source

Journal of electronic materials. 2006, Vol 35, Num 1, pp 147-153, 7 p ; ref : 9 ref

CODEN
JECMA5
ISSN
0361-5235
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
Ag/Cu pad Au/Ni/Cu pad Sn-8Zn-20In solder ball shear strength intermetallic compounds
Keyword (fr)
Alliage ternaire Assemblage brasage tendre Calorimétrie différentielle balayage Composé intermétallique Etain alliage Etude expérimentale Fractographie Indium alliage Interface Liaison matériau Microstructure Morphologie Métallisation Or Résistance cisaillement Technologie BGA Vieillissement Zinc alliage Ag Alliage InSnZn Au Cu In Sn Zn Ni Composé minéral Métal transition alliage Métal transition
Keyword (en)
Ternary alloys Soldered joints Differential scanning calorimetry Intermetallic compounds Tin alloys Experimental study Fractography Indium alloys Interfaces Bonding Microstructure Morphology Metallizing Gold Shear strength Ball grid arrays Aging Zinc alloys Inorganic compounds Transition element alloys Transition elements
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60B Mechanical and acoustical properties of condensed matter / 001B60B20 Mechanical properties of solids / 001B60B20D Elasticity, elastic constants

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)

Pacs
6220D Elasticity, elastic constants

Pacs
8540L Metallization, contacts, interconnects; device isolation

Discipline
Electronics Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17447113

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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