Prediction of PIN diode reverse recovery
- Author
- YUEQING WANG1 ; QINGYOU ZHANG1 ; JIANPING YING1 ; CHAOQUN SUN1
[1] Delta Power Electronics Center 238 Minxia Road, Caolu Industry Zone, Pudong, Shanghai, 201209, China - Conference title
- PESC'04 (2004 IEEE 35th annual power electronics specialists conference)
- Conference name
- Power electronics specialists conference (35 ; Aachen 2004-06-20)
- Author (monograph)
- IEEE Power Electronics Society, United States (Organiser of meeting)
- Source
PESC'04 (2004 IEEE 35th annual power electronics specialists conference). 2004 ; 6Vol, pp 2956-2959, 4 p ; ref : 9 ref
- ISBN
- 0-7803-8399-0
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- IEEE, Piscataway NJ
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse conceptuelle Brouillage Diode couche intrinsèque Perte commutation Restauration(propriété)
- Keyword (en)
- Conceptual analysis Electromagnetic interference p i n diode Switching loss Recovery(properties)
- Keyword (es)
- Análisis conceptual Interferencia Diodo capa intrínseca Pérdida conmutación Restauración(propiedad)
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F03 Diodes
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17458322
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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