Sensitivity and resolution of evanescent microwave microscope
- Author
- KLEISMIT, Richard A1 2 ; KAZIMIERCZUK, Marian K3 ; KOZLOWSKI, Gregory2 4
[1] Department of Electrical Engineering, Wright State University, Air Force Research Laboratory/Materials and Manufacturing Direc torate, Wright-Patterson AFB, Dayton, OH 45431, United States
[2] Anteon Corporation, Dayton, OH 45431, United States
[3] Department of Electrical Engineering, Wright State University, Dayton, OH 45435, United States
[4] Physics Department, Wright State University, Dayton, OH 45435, United States - Source
IEEE transactions on microwave theory and techniques. 2006, Vol 54, Num 2, pp 639-647, 9 p ; 1 ; ref : 10 ref
- CODEN
- IETMAB
- ISSN
- 0018-9480
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Complex permittivity evanescent microwave microscopy near-field nondestructive evaluation resolution sensitivity sensor superconductors
- Keyword (fr)
- Capteur mesure Champ hyperfréquence Champ proche Constante diélectrique complexe Câble coaxial Essai non destructif Microscope Microscopie Mode TEM Ordre 1 Propriété diélectrique Propriété électromagnétique Schéma équivalent Supraconducteur
- Keyword (en)
- Measurement sensor Microwave field Near field Complex permittivity Coaxial cable Non destructive test Microscope Microscopy TEM mode First order Dielectric properties Electromagnetic properties Equivalent circuit Superconducting materials
- Keyword (es)
- Captador medida Campo hiperfrecuencia Campo próximo Constante dieléctrica compleja Cable coaxial Ensayo no destructivo Microscopio Microscopía Modo Onda Electromagnética Transversal Orden 1 Propiedad dieléctrica Propiedad electromagnética Esquema equivalente Supraconductor
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17504011
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TMTT.2005.862668 
https://dx.doi.org/10.1109/TMTT.2005.862668
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