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Silicon cleaning and defect passivation effects of hydrogen cyanide aqueous solutions

Author
TAKAHASHI, Masao1 ; LIU, Yueh-Ling1 ; FUJIWARA, Naozumi1 ; IWASA, Hitoo1 ; KOBAYASHI, Hikaru1
[1] Institute of Scientific and Industrial Research, Japan Science and Technology Organization, Osaka University, and CREST. 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
Source

Solid state communications. 2006, Vol 137, Num 5, pp 263-267, 5 p ; ref : 24 ref

CODEN
SSCOA4
ISSN
0038-1098
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
81.60.Cp 82.65.Yh 84.60.Jt A. Semiconductors 85.40.Hp A. Surfaces and interfaces C. Impurities in semiconductors D. Photoconductivity and photovoltaics E. X-ray photoelectron spectroscopy
Keyword (fr)
Adsorption Cellule solaire Etat défaut Jonction p n Passivation Semiconducteur Silicium oxyde Silicium Solution aqueuse Spectre UV Spectre absorption 7155C 8460J Si SiO2
Keyword (en)
Adsorption Solar cells Defect states p n junctions Passivation Semiconductor materials Silicon oxides Silicon Aqueous solutions Ultraviolet spectra Absorption spectra
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A55 Impurity and defect levels / 001B70A55C Elemental semiconductors

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D06 Energy / 001D06C Natural energy / 001D06C02 Solar energy / 001D06C02D Photovoltaic conversion / 001D06C02D1 Solar cells. Photoelectrochemical cells

Discipline
Energy Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17561161

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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