Refractive indices of textured indium tin oxide and zinc oxide thin films
- Author
- YANG, Y1 ; SUN, X. W1 ; CHEN, B. J1 ; XU, C. X1 ; CHEN, T. P1 ; SUN, C. Q1 ; TAY, B. K1 ; SUN, Z2
[1] School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore
[2] Nanotech Center, East China Normal University, North Zhongshan Rd. 3663, Shanghai 200062, China - Source
Thin solid films. 2006, Vol 510, Num 1-2, pp 95-101, 7 p ; ref : 29 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Author keyword
- 68.55.Jk 78.20Ci Conductivity Ellipsometry Indium tin oxide Optical constants Zinc oxide
- Keyword (fr)
- Arc sous vide Composé minéral Conductivité électrique Couche mince Couche tampon Ellipsométrie Etain oxyde Etude expérimentale Facteur transmission Indice réfraction Indium oxyde Microscopie force atomique Morphologie surface Métal transition composé Pulvérisation irradiation Rugosité Semiconducteur II-VI Zinc oxyde 7820C Substrat verre ZnO
- Keyword (en)
- Vacuum arcs Inorganic compounds Electrical conductivity Thin films Buffer layer Ellipsometry Tin oxides Experimental study Transmittance Refractive index Indium oxides Atomic force microscopy Surface morphology Transition element compounds Sputtering Roughness II-VI semiconductors Zinc oxides
- Keyword (es)
- Capa tampón Factor transmisión
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20C Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15C Deposition by sputtering
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17785639
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2005.12.265 
https://dx.doi.org/10.1016/j.tsf.2005.12.265
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