Fastsies : A fast stochastic integral equation solver for modeling the rough surface effect
- Author
- ZHENHAI ZHU1 ; WHITE, Jacob2
[1] Cadence Berkeley Labs, Berkeley, CA 94704, United States
[2] Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology, Cambridge, MA 02139, United States - Conference title
- ICCAD-2005 (International Conference on Computer Aided Design)
- Conference name
- IEEE/ACM International Conference on Computer-Aided Design (San Jose CA 2005)
- Author (monograph)
- IEEE Circuits and systems society, United States (Organiser of meeting)
- Source
ICCAD-2005 (International Conference on Computer Aided Design). 2005 ; 1Vol, pp 675-682, 8 p ; ref : 18 ref
- ISBN
- 0-7803-9254-X
- Scientific domain
- Electronics
- Publisher
- ACM, New York NY
/
IEEE, Piscataway NJ
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Capacité électrique Circuit intégré Diminution coût Discrétisation Effet surface Equation intégrale Equation stochastique Interconnexion Modélisation Rugosité Surface lisse Surface rugueuse Valeur moyenne
- Keyword (en)
- Capacitance Integrated circuit Cost lowering Discretization Surface effect Integral equation Stochastic equation Interconnection Modeling Roughness Smooth surface Rough surface Mean value
- Keyword (es)
- Capacitancia Circuito integrado Reducción costes Discretización Efecto superficie Ecuación integral Ecuación estocástica Interconexión Modelización Rugosidad Superficie lisa Superficie rugosa Valor medio
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17834206
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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