De Haas-van Alphen effect in anti-ferromagnetic SmCu2
- Autor
- MAEZAWA, Kunihiko1 ; HORITA, Hideki1 ; FUKUHARA, Tadashi1 ; ISIKAWA, Yosikazu2 ; SATO, Kiyoo2
[1] Faculty of Engineering, Toyama Prefectural University, Toyama 939-0398, Japan
[2] Faculty of Science, Toyama University, Toyama 930-8555, Japan - Titulo de la conferencia
- Proceedings of the International Conference on Strongly Correlated Electron Systems, SCES 2005, Vienna, Austria, 26-30 July 2005
- Nombre de la conferencia
- International Conference on Strongly Correlated Electron Systems (Vienna 2005-07-26)
- Autor ( monografía)
- BAUER, E (Editor)1 ; HILSCHER, G (Editor)1 ; MICHOR, H (Editor)1 ; MüLLER, H (Editor)1
[1] Technische Universität Wien, Institut für Festkörperphysik, Wiedner Haupstrasse 8-10, 1040 Wien, Austria - Fuente
Physica. B, Condensed matter. 2006, Vol 378-80, pp 1083-1084, 2 p ; ref : 7 ref
- ISSN
- 0921-4526
- Campo Científico
- Crystallography; Condensed state physics
- Editor
- Elsevier, Amsterdam
- País de la publicación
- Netherlands
- Tipo de documento
- Conference Paper
- Idioma
- French
- Palabra clave de autor
- 71.20.Eh SmCu2 Anti-ferromagnetic state Fermi surface de Haas-van Alphen effect
- Palabra clave (fr)
- Cuivre alliage Effet de Haas van Alphen Lanthanide alliage Masse effective cyclotron Matériau antiferromagnétique Métal transition alliage Samarium alliage Surface Fermi Variation angulaire 7118
- Palabra clave (in)
- Copper alloys De Haas-van Alphen effect Rare earth alloys Cyclotron mass Antiferromagnetic materials Transition element alloys Samarium alloys Fermi surface Angular variation
- Palabra clave (es)
- Variación angular
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A18 Fermi surface: calculations and measurements; effective mass, g factor
- Disciplina
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 17845979
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.physb.2006.01.430 
https://dx.doi.org/10.1016/j.physb.2006.01.430
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