A low power deterministic test using scan chain disable technique
- Author
- YOU, Zhiqiang1 ; IWAGAKI, Tsuyoshi2 ; INOUE, Michiko3 ; FUJIWARA, Hideo3
[1] Software School, Hunan University, Changsha, 410082, China
[2] Graduate School of Information Science, Japan Advanced Institute of Science and Technology, Nomishi, 923-1292, Japan
[3] Graduate School of Information Science, Nara Institute of Science and Technology (NAIST), Ikomashi, 630-0192, Japan - Source
IEICE transactions on information and systems. 2006, Vol 89, Num 6, pp 1931-1939, 9 p ; ref : 19 ref
- ISSN
- 0916-8532
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Oxford University Press, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- deterministic test full scan testing low power testing scan chain disable tabu search algorithm
- Keyword (fr)
- Approche déterministe Circuit VLSI Méthode essai Puissance faible Recherche tabou
- Keyword (en)
- Deterministic approach VLSI circuit Test method Low power Tabu search
- Keyword (es)
- Enfoque determinista Circuito VLSI Método ensayo Potencia débil Búsqueda tabú
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17881843
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1093/ietisy/e89-d.6.1931 
https://dx.doi.org/10.1093/ietisy/e89-d.6.1931
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