Silicide formation in Co/Si system investigated by depth-resolved positron annihilation and X-ray diffraction
- Author
- ABHAYA, S1 ; VENUGOPAL RAO, G1 ; KALAVATHI, S1 ; SASTRY, V. S1 ; AMARENDRA, G1
[1] Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India - Source
Surface science. 2006, Vol 600, Num 13, pp 2762-2765, 4 p ; ref : 15 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Cobalt silicides Positron spectroscopy X-ray diffraction
- Keyword (fr)
- Annihilation positon Cobalt siliciure Diffraction RX Silicium Si
- Keyword (en)
- Positron annihilation Cobalt silicides XRD Silicon
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17899657
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.susc.2006.04.043 
https://dx.doi.org/10.1016/j.susc.2006.04.043
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