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The first fully integrated quad-band GSM/GPRS receiver in a 90-nm digital CMOS process

Author
MUHAMMAD, Khurram1 ; HO, Yo-Chuol1 ; VEMULAPALLI, Sudheer K1 ; LARSON, S1 ; MURPHY, Thomas1 ; LEIPOLD, Dirk1 ; CRUISE, Patrick1 ; JAEHNIG, J1 ; LEE, Meng-Chang1 ; STASZEWSKI, Robert Bogdan1 ; STASZEWSKI, Roman1 ; MAGGIO, Ken1 ; MAYHUGH, Terry L1 ; HUNG, Chih-Ming1 ; JUNG, T1 ; ELAHI, Imtinan1 ; LIN, Charles1 ; DENG, Irene1 ; FERNANDO, C1 ; WALLBERG, John L1
[1] Texas Instruments Incorporated, Dallas, TX 75243, United States
Conference title
2005 Custom Integrated Circuits Conference
Conference name
IEEE 2005 Custom Integrated Circuits Conference (CICC) (CICC) (San Jose, CA 2005-09-18)
Author (monograph)
SAVOJ, Jafar (Author of introductory parts)1 ; KOLAGOTLA, Ravi K (Author of introductory parts)2 ; GHARPUREY, Ranjit (Author of introductory parts)3
IEEE, Solid-State Circuits Society, Piscataway NJ 08854, United States (Organiser of meeting)
[1] Rambus, Inc., Los Altos, CA 94022, United States
[2] Intel Corporation, Austin, TX 78746, United States
[3] University of Texas, Austin, TX 78712, United States
Source

IEEE journal of solid-state circuits. 2006, Vol 41, Num 8, pp 1772-1783, 12 p ; ref : 22 ref

CODEN
IJSCBC
ISSN
0018-9200
Scientific domain
Electronics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Author keyword
All-digital phase-locked loop (ADPLL) GPRS GSM built-in self-test (BIST) cellular low-area low-cost mobile phones multi-tap direct sampling mixer (MTDSM) radio frequency (RF) sigma-delta single-chip system-on-chip (SoC) transceiver
Keyword (fr)
Autotest Boucle verrouillage phase numérique Boucle verrouillage phase Circuit intégré Consommation énergie électrique Diminution coût Emetteur récepteur Filtre analogique Gestion mémoire Linéarisation Mélangeur Oscillateur local Processeur Récepteur Rétroaction Signal analogique Taux échantillonnage Technologie MOS complémentaire Temps discret Temps traitement Traitement analogique Traitement signal
Keyword (en)
Built in self test Digital phase locked loops Phase locked loop Integrated circuit Power consumption Cost lowering Transceiver Analog filter Storage management Linearization Mixer Local oscillator Processor Receiver Feedback regulation Analog signal Sampling rate Complementary MOS technology Discrete time Processing time Analog processing Signal processing
Keyword (es)
Autoprueba Bucle enclavamiento fase Circuito integrado Reducción costes Emisor receptor Filtro analógico Gestión memoria Linearización Mezclador Oscilador local Procesador Receptor Retroacción Señal analógica Razón muestreo Tecnología MOS complementario Tiempo discreto Tiempo proceso Tratamiento analógico Procesamiento señal
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A5 Circuits of signal characteristics conditioning (including delay circuits)

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18032573

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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