Scanning electrochemical microscope observation of defects in a hexadecanethiol monolayer on gold with shear force-based tip-substrate positioning
- Author
- YAMADA, Hiroshi1 ; OGATA, Mitsuko1 ; KOIKE, Tohru1
[1] Department of Applied Chemistry, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan - Source
Langmuir. 2006, Vol 22, Num 18, pp 7923-7927, 5 p ; ref : 39 ref
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Cisaillement Couche monomoléculaire Défaut Electrochimie Electrode disque Force Formation image Microscope balayage Or Potentiel Substrat Transfert électron Métal transition
- Keyword (en)
- Shear Monolayer Defect Electrochemistry Disk electrode Force Imaging Scanning microscope Gold Potential Substrate Electron transfer Transition metal
- Keyword (es)
- Cizalladura Capa monomolecular Defecto Electroquímica Electrodo disco Fuerza Formación imagen Microscopio barrido Oro Potencial Substrato Transferencia electrón Metal transición
- Classification
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18042726
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/la0613171 
https://dx.doi.org/10.1021/la0613171
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