Scanning electrochemical microscopy investigations of monolayers bound to p-type silicon substrates
- Author
- GHILANE, Jalal1 ; HAUQUIER, Fanny1 ; FABRE, Bruno1 ; HAPIOT, Philippe1
[1] Matière Condensée et Systèmes Electroactifs, Sciences Chimiques de Rennes, UMR CNRS 6226, Université de Rennes 1, Campus de Beaulieu, 35042 Rennes, France - Source
Analytical chemistry (Washington, DC). 2006, Vol 78, Num 17, pp 6019-6025, 7 p ; ref : 30 ref
- CODEN
- ANCHAM
- ISSN
- 0003-2700
- Scientific domain
- Analytical chemistry
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Alkyle Cation Couche monomoléculaire Microscopie électronique balayage Microélectrode Méthode électrochimique Or Silicium Transfert électron
- Keyword (en)
- Alkyl Cations Monolayer Scanning electron microscopy Microelectrode Electrochemical method Gold Silicon Electron transfer
- Keyword (es)
- Alquilo Cation Capa monomolecular Microscopía electrónica barrido Microeléctrodo Método electroquímico Oro Silicio Transferencia electrón
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04E Electrochemical methods
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18087246
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/ac060058h 
https://dx.doi.org/10.1021/ac060058h
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