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SIMS quantification of very low hydrogen contents

Author
RHEDE, D1 ; WIEDENBECK, M1
[1] GeoForschungsZentrum Potsdam, Telegrafenberg, 14473 Potsdam, Germany
Conference title
Proceedings of the Fifteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XV, The University of Manchester, UK, September 12-16, 2005
Conference name
SIMS XV International Conference on Secondary Ion Mass Spectrometry (15 ; Manchester 2005-09-12)
Author (monograph)
VICKERMAN, John C (Editor)1 ; DOWSETT, Mark G (Editor)2 ; GILMORE, Ian S (Editor)3 ; HENDERSON, Alex (Editor)1
[1] The University of Manchester, United Kingdom
[2] University of Warwick, United Kingdom
[3] National Physical Laboratory, United Kingdom
Source

Applied surface science. 2006, Vol 252, Num 19, pp 7152-7154, 3 p ; ref : 9 ref

ISSN
0169-4332
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Author keyword
Adsorption Background Hydrogen Vacuum contamination
Keyword (fr)
Hydrogène SIMS H
Keyword (en)
Hydrogen SIMS
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18103044

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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