Investigation of programming charge distribution in nonoverlapped implantation nMOSFETs
- Author
- JENG, Erik S1 ; KUO, Pai-Chun1 ; HSIEH, Chien-Sheng1 ; FAN, Chen-Chia1 ; LIN, Kun-Ming1 ; HSU, Hui-Chun1 ; CHOU, Wu-Ching2
[1] Department of Electronic Engineering, Chun-Yuan Christian University, Chun-Li 320, Taiwan, Province of China
[2] Department of Electro-Physics, National Chiao-Tung University, Hsinchu 300, Taiwan, Province of China - Source
I.E.E.E. transactions on electron devices. 2006, Vol 53, Num 10, pp 2517-2524, 8 p ; ref : 16 ref
- CODEN
- IETDAI
- ISSN
- 0018-9383
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Channel hot electron injection (CHEI) charge-pumping nonoverlapped implantation (NOI) nonvolatile memory (NVM)
- Keyword (fr)
- Circuit intégré Dispositif à mémoire Distribution densité Electron chaud Injection électron Modèle 2 dimensions Mémoire non volatile Piégeage porteur charge Pompage charge Simulateur Technologie NMOS Transistor MOSFET
- Keyword (en)
- Integrated circuit Memory devices Density distribution Hot electron Electron injection Two dimensional model Non volatile memory Charge carrier trapping Charge pumping Simulator NMOS technology MOSFET
- Keyword (es)
- Circuito integrado Distribución densidad Electrón caliente Inyección electrón Modelo 2 dimensiones Memoria no volátil Captura portador carga Bombeo carga Simulador Tecnología NMOS
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03I Storage and reproduction of information / 001D03I02 Magnetic and optical mass memories
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18156714
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TED.2006.882044 
https://dx.doi.org/10.1109/TED.2006.882044
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