Interaction of an open-ended rectangular waveguide probe with an arbitrary-shape surface crack in a lossy conductor
- Author
- MAZLUMI, Farhad1 ; HESAMEDIN SADEGHI, Seyed H2 ; MOINI, Rouzbeh3
[1] Civil Aviation Technology College, Tehran 13878, Iran, Islamic Republic of
[2] University of Wisconsin-Milwaukee, Milwaukee WI 53201, United States
[3] Electrical Engineering Department, Amirkabir University of Technology, Tehran 15914, Iran, Islamic Republic of - Source
IEEE transactions on microwave theory and techniques. 2006, Vol 54, Num 10, pp 3706-3711, 6 p ; ref : 10 ref
- CODEN
- IETMAB
- ISSN
- 0018-9480
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Lossy systems mode-matching methods nondestructive testing rectangular waveguides
- Keyword (fr)
- Codage Corps forme arbitraire Essai non destructif Fissure Guide onde ouvert Guide onde rectangulaire Impédance surface Matrice diffusion Milieu dissipatif Modélisation Méthode adaptation mode Méthode matricielle Méthode numérique Méthode élément fini Signal sortie
- Keyword (en)
- Coding Arbitrary shape body Non destructive test Crack Open waveguide Rectangular waveguide Surface impedance Scattering matrix Lossy medium Modeling Mode matching method Matrix method Numerical method Finite element method Output signal
- Keyword (es)
- Codificación Cuerpo forma arbitraria Ensayo no destructivo Fisura Guía onda abierta Guía onda rectangular Impedancia superficie Matriz difusión Medio dispersor Modelización Método adaptación modo Método matriz Método numérico Método elemento finito Señal salida
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02B Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18176190
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TMTT.2006.882879 
https://dx.doi.org/10.1109/TMTT.2006.882879
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