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Digital simulation of fast cyclic voltammogram by integration of the double layer charging current

Author
DENG, Z.-X1 ; LIN, X.-Q1
[1] Laboratory of Electroanalytical Chemistry, Department of Chemistry, University of Science and Technology of China, Hefei 230026, China
Source

Journal of electroanalytical chemistry (1992). 1999, Vol 464, Num 2, pp 215-221 ; ref : 10 ref

ISSN
1572-6657
Scientific domain
General chemistry, physical chemistry; Metallurgy, welding
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Chute tension Etude théorique Modélisation Schéma équivalent Simulation numérique Voltammétrie cyclique
Keyword (en)
Voltage fall Theoretical study Modeling Equivalent circuit Numerical simulation Cyclic voltammetry
Keyword (es)
Caída tensión Estudio teórico Modelización Esquema equivalente Simulación numérica Voltametría cíclica
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01H Electrochemistry / 001C01H02 Electrodes: preparations and properties / 001C01H02B Other electrodes

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1819271

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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