Evaluation and display of polarimetric image data using long-wave cooled microgrid focal plane arrays
- Author
- BOWERS, David L1 ; BOGER, James K1 ; WELLEMS, L. David1 ; BLACK, Wiley T1 ; ORTEGA, Steve E1 ; RATLIFF, Bradley M1 ; FETROW, Matthew P2 ; HUBBS, John E3 ; TYO, J. Scott4
[1] Applied Technology Associates, 1300 Britt St. SE, Albuquerque, NM 87123, United States
[2] Air Force Research Laboratory/VSSS, 3550 Aberdeen SE, Kirtland AFB, NM 87117, United States
[3] Air Force Research Laboratory/VSSS, Infrared Radiation Effects Laboratory, Ball Aerospace & Technologies Corp., P.O. Box 5209, Albuquerque, New Mexico 87185, United States
[4] Electrical and Computer Engineering Department, University of New Mexico, Albuquerque, NM 87131-1356, United States - Conference title
- Polarization (measurement, analysis, and remote sensing VII)
- Conference name
- Polarization. Conference (7 ; 2006)
- Author (monograph)
- Goldstein, Dennis H (Editor); Chenault, David B (Editor)
Society of Photo-optical Instrumentation Engineers, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2006 ; 1Vol, pp 62400F.1-62400F.10 ; ref : 7 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 0-8194-6296-9
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham, Washington
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Azote Echantillonnage Erreur mesure Fonction réponse Matrice plan focal Matériau capteur Pixel Polarimètre Polarimétrie Polarisation optique Polarisation rectiligne Traitement image 0760F 4230V HgCdTe
- Keyword (en)
- Nitrogen Sampling Measurement errors Response functions Focal plane arrays Sensor materials Pixel Polarimeters Polarimetry Optical polarization Linear polarization Image processing
- Keyword (es)
- Muestreo Pixel
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18202803
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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