Paraxial speckle-based metrology systems with an aperture
- Author
- KELLY, Damien P1 ; WARD, Jennifer E1 ; HENNELLY, Bryan M1 ; GOPINATHAN, Unnikrishnan1 ; O'NEILL, Feidhlim T1 ; SHERIDAN, John T1
[1] School of Electrical, Electronic and Mechanical Engineering, College of Engineering, Mathematical and Physical Sciences, University College Dublin, Belfield, Dublin, Ireland - Source
Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2006, Vol 23, Num 11, pp 2861-2870, 10 p ; ref : 50 ref
- ISSN
- 1084-7529
- Scientific domain
- Electronics; Optics
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Méthode mesure Ouverture optique Speckle Traitement signal 4230M
- Keyword (en)
- Measuring methods Aperture Speckles Signal processing
- Keyword (es)
- Abertura óptica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30M Speckle and moire patterns
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18225863
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/JOSAA.23.002861 
https://dx.doi.org/10.1364/JOSAA.23.002861
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