Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18255608

Investigation of negative differential resistance properties of self-assembled dipyridinium using STM

Author
LEE, Nam-Suk1 ; SHIN, Hoon-Kyu1 ; KWON, Young-Soo1
[1] Department of Electrical Engineering, Dong-A University, Busan, 604-714, Korea, Republic of
Source

Colloids and surfaces. A, Physicochemical and engineering aspects. 2006, Vol 290, Num 1-3, pp 77-81, 5 p ; ref : 18 ref

ISSN
0927-7757
Scientific domain
Biochemistry, molecular biology, biophysics; General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Polymers, paint and wood industries
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Negative differential resistance (NDR) Scanning tunneling microscopy/spectroscopy (STM/STS)
Keyword (fr)
Autoassemblage Microscopie tunnel balayage Résistance
Keyword (en)
Self assembly Scanning tunneling microscopy Resistance
Keyword (es)
Autoensamble Microscopía túnel barrido Resistencia
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18255608

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Access to the document

Searching the Web