Reflection high-energy positron diffraction pattern from a Si(111)-(7×7) surface
- Author
- HAYASHI, K1 ; KAWASUSO, A1 ; ICHIMIYA, A1 2
[1] Advanced Science Research Center, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan
[2] Department of Mathematical and Physical Science, Japan Women's University, 2-8-1 Mejiro-dai, Bunkyo-ku, Tokyo 112-8681, Japan - Source
Surface science. 2006, Vol 600, Num 19, pp 4426-4429, 4 p ; ref : 22 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Reflection high-energy electron diffraction (RHEED); Surface structure and topography; Silicon; Low index single crystal surfaces morphology roughness
- Keyword (fr)
- Diagramme diffraction Monocristal RHEED Rugosité Silicium Structure surface Topographie surface Si
- Keyword (en)
- Diffraction pattern Monocrystals RHEED Roughness Silicon Surface structure Surface topography
- Keyword (es)
- Diagrama difracción
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18255744
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.susc.2006.05.048 
https://dx.doi.org/10.1016/j.susc.2006.05.048
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