Microscopic analysis of extreme nonlinear optics in semiconductor nanostructures
- Author
- GOLDE, Daniel1 ; MEIER, Torsten1 ; KOCH, Stephan W1
[1] Department of Physics and Material Sciences Center, Philipps University, Renthof 5, 35032 Marburg, Germany - Source
Journal of the Optical Society of America. B, Optical physics (Print). 2006, Vol 23, Num 12, pp 2559-2565, 7 p ; ref : 24 ref
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Equation Bloch Etude théorique Nanostructure Optique non linéaire Optique ultrarapide Propriété optique Puits quantique semiconducteur Semiconducteur Solution numérique Système 2 niveaux 4265R
- Keyword (en)
- Bloch equations Theoretical study Nanostructures Nonlinear optics Ultrafast optics Optical properties Semiconductor quantum wells Semiconductor materials Numerical solution Two-level systems
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B65 Nonlinear optics / 001B40B65R Ultrafast processes; optical pulse generation and pulse compression
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18340715
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/JOSAB.23.002559 
https://dx.doi.org/10.1364/JOSAB.23.002559
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