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Random effects Weibull regression model for occupational lifetime

Author
SO YOUNG SOHN1 ; IN SANG CHANG1 ; TAE HEE MOON1
[1] Department of Information & Industrial Engineering 134, Shinchon-dong, Sudaemoon-ku, Seoul 120-749, Korea, Republic of
Source

European journal of operational research. 2007, Vol 179, Num 1, pp 124-131, 8 p ; ref : 21 ref

CODEN
EJORDT
ISSN
0377-2217
Scientific domain
Control theory, operational research
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Mean residual life Occupational lifetime Random effects Weibull model Reliability Survival analysis Turnover rate
Keyword (fr)
Analyse régression Analyse survie Cerveau Durabilité Durée vie Effet aléatoire Employé Encéphale Fiabilité Gestion ressources humaines Loi Weibull Main d'oeuvre Modèle régression Prévision Système incertain Système nerveux central Turnover Vie résiduelle moyenne
Keyword (en)
Regression analysis Survival analysis Brain Durability Lifetime Random effect Employee Encephalon Reliability Human resource management Weibull distribution Manpower Regression model Forecasting Uncertain system Central nervous system Turnover Mean residual life
Keyword (es)
Análisis regresión Cerebro Durabilidad Tiempo vida Efecto aleatorio Empleado Encéfalo Fiabilidad Ley Weibull Mano de obra Modelo regresión Previsión Sistema incierto Sistema nervioso central Turnover Vida residual media
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D01 Operational research. Management science / 001D01A Operational research and scientific management / 001D01A06 Reliability theory. Replacement problems

Discipline
Operational research. Management
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18403339

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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