Dissociative adsorption of molecular hydrogen on silicon surfaces
- Author
- DÜRR, M1 2 ; HÖFER, U1
[1] Department of Physics and Materials Science Centre, Philipps University of Marburg, Renthof 5, 35032 Marburg, Germany
[2] Department of Natural Sciences -Chemical Engineering, University of Applied Sciences. Kanalstr. 33, 73728 Esslingen, Germany - Source
Surface science reports. 2006, Vol 61, Num 12, pp 465-526, 62 p ; ref : 242 ref
- CODEN
- SSREDI
- ISSN
- 0167-5729
- Scientific domain
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Activated adsorption Dissociative adsorption Hydrogen Reaction dynamics: Scanning tunnelling microscopy Recombinative desorption Second-harmonic generation Semiconductor surface Silicon Sticking coefficient Supersonic molecular beam
- Keyword (fr)
- Article synthèse Coefficient collage Degré recouvrement Distorsion réseau Désorption Excitation thermique Faisceau moléculaire Génération harmonique 2 Génération harmonique optique Hydrogène Liaison disponible Liaison hydrogène Microscopie tunnel balayage Méthode fonctionnelle densité Préadsorption Réaction chimique Semiconducteur Silicium Température surface H2 Si
- Keyword (en)
- Reviews Sticking coefficient Coverage rate Lattice distortion Desorption Thermal excitation Molecular beams Second harmonic generation Optical harmonic generation Hydrogen Dangling bonds Hydrogen bonds Scanning tunneling microscopy Density functional method Preadsorption Chemical reactions Semiconductor materials Silicon Surface temperature
- Keyword (es)
- Coeficiente adherencia Grado recubrimiento Distorsión red Excitación térmica Preadsorción
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H45 Solid-fluid interfaces
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18449906
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.surfrep.2006.08.002 
https://dx.doi.org/10.1016/j.surfrep.2006.08.002
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