RHEED wave functions and the effect of reconstruction on secondary electron emission from the Si(100) surface
- Author
- KAWAMURA, T1 ; MAKSYM, P. A2
[1] Department of Mathematics and Physics, University of Yamanashi, Kofu, Yamanashi 400-8510, Japan
[2] Department of Physics and Astronomy, University of Leicester, University Road, Leicester, LEI 7RH, United Kingdom - Source
Surface science. 2007, Vol 601, Num 3, pp 822-829, 8 p ; ref : 18 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Electron-solid diffraction RHEED electron intensity RHEED wave function RHEED Silicon
- Keyword (fr)
- Diffraction électron Emission électronique secondaire Fonction onde RHEED Silicium Si
- Keyword (en)
- Electron diffraction Secondary electron emission Wave functions RHEED Silicon
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18489394
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.susc.2006.11.023 
https://dx.doi.org/10.1016/j.susc.2006.11.023
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