Competing roles of microstructure and flaw size
- Author
- MCGREEVY, T. E1 ; SOCIE, D. F2
[1] Advanced Materials Technology, Caterpillar Technical Center, Peoria, IL, United States
[2] University of Illinois at Urbana-Champaign, Urbana, IL, United States - Source
Fatigue & fracture of engineering materials & structures (Print). 1999, Vol 22, Num 6, pp 495-508 ; ref : 30 ref
- CODEN
- FFESEY
- ISSN
- 8756-758X
- Scientific domain
- Metallurgy, welding; Polymers, paint and wood industries
- Publisher
- Blackwell Science, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Acier haute résistance Dimension défaut Fatigue Fissure fatigue Limite fatigue Modélisation Mécanique rupture Propriété mécanique Prédiction Résistance fatigue
- Keyword (en)
- High strength steel Defect size Fatigue Fatigue crack Fatigue limit Modeling Fracture mechanics Mechanical properties Prediction Fatigue strength
- Keyword (es)
- Acero alta resistencia Dimensión imperfección Fatiga Fisura fatiga Límite fatiga Modelización Mecánica ruptura Propiedad mecánica Predicción Resistencia fatiga
- Keyword (de)
- Hochfester Stahl Fehlergroesse Ermuedung Ermuedungsriss Ermuedungsgrenze Bruchmechanik Dauerfestigkeit
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11G Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology / 001D11G03 Fatigue
- Discipline
- Metals. Metallurgy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1849944
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1046/j.1460-2695.1999.00190.x 
https://dx.doi.org/10.1046/j.1460-2695.1999.00190.x
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