Simulation of contaminates around the solid immersion lens in a near-field optical recording system
- Author
- TERRELL, Elon1 ; HIGGS, C. Fred1
[1] Data Storage Systems Center, Mechanical Engineering Department, Carnegie Mellon University, Pittsburgh, PA 15213-2890, United States - Source
IEEE transactions on magnetics. 2007, Vol 43, Num 3, pp 1086-1092, 7 p ; ref : 16 ref
- CODEN
- IEMGAQ
- ISSN
- 0018-9464
- Scientific domain
- Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Near-field recording particulate contamination solid immersion lens
- Keyword (fr)
- Contamination Enregistrement optique Propriété magnétique Simulation
- Keyword (en)
- Contamination Optical recording Magnetic properties Simulation
- Keyword (es)
- Grabación optica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A90 Other topics in materials science
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18554168
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TMAG.2006.888697 
https://dx.doi.org/10.1109/TMAG.2006.888697
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