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Dielectric tensor measurement from a single Mueller matrix image

Author
BEAUDRY, Neil A1 ; YANMING ZHAO2 ; CHIPMAN, Russell3
[1] Axometrics Inc., 515 Sparkman Dr, Huntsville, Alabama 35816, United States
[2] School of Optometry, Indiana University, 800 East Atwater Avenue, Bloomington, Indiana 47405, United States
[3] College of Optical Sciences, University of Arizona, 1630 East University Boulevard, Tucson, Arizona 85721, United States
Source

Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2007, Vol 24, Num 3, pp 814-824, 11 p ; ref : 35 ref

ISSN
1084-7529
Scientific domain
Electronics; Optics
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Biréfringence Couche mince Ellipsométrie Etude théorique Matrice Mueller Matériau diélectrique Orientation biaxiale Polarimétrie Polarisation optique Propriété optique 0760F 4225L
Keyword (en)
Birefringence Thin films Ellipsometry Theoretical study Mueller matrix Dielectric materials Biaxial orientation Polarimetry Optical polarization Optical properties
Keyword (es)
Matriz Mueller Orientación biaxial
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25L Birefringence

Discipline
Metrology Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18554816

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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