Comparison of femtosecond and nanosecond laser-induced damage in HfO2 single-layer film and HfO2-SiO2 high reflector
- Author
- LEI YUAN1 2 ; YUANAN ZHAO1 ; GUANGQIANG SHANG1 2 ; CHENGREN WANG1 2 ; HONGBO HE1 ; JIANDA SHAO1 ; ZHENGXIU FAN1
[1] Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
[2] Graduate School of the Chinese Academy of Sciences, Beijing 100039, China - Source
Journal of the Optical Society of America. B, Optical physics (Print). 2007, Vol 24, Num 3, pp 538-543, 6 p ; ref : 23 ref
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé binaire Couche mince Domaine temps fs Domaine temps ns Détérioration par rayonnement Hafnium oxyde Irradiation laser Laser Multicouche Optique ultrarapide Réflecteur Silicium oxyde 4265R 4279F 4288 Hf O HfO2 O Si SiO2
- Keyword (en)
- Binary compounds Thin films fs range ns range Radiation damage Hafnium oxides Laser irradiation Lasers Multilayers Ultrafast optics Reflectors Silicon oxides
- Keyword (es)
- Deteriorización por irradiación Irradiación láser
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B65 Nonlinear optics / 001B40B65R Ultrafast processes; optical pulse generation and pulse compression
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79F Reflectors, beam splitters, and deflectors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B88 Radiation effects on optical elements, devices, and systems
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18574098
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/JOSAB.24.000538 
https://dx.doi.org/10.1364/JOSAB.24.000538
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