An automated, complete, structural test solution for SERDES
- Author
- SUNTER, Stephen1 ; ROY, Aubin1 ; COTE, J.-F1
[1] LogicVision, Inc, Ottawa, Canada - Conference title
- International Test Conference 2004 (October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA)
- Conference name
- International Test Conference (35 ; Charlotte NC 2004)
- Author (monograph)
- IEEE Computer Society, Test Technology Technical Committee, United States (Organiser of meeting)
Institute of Electrical and Electronics Engineers, Philadelphia Section, United States (Organiser of meeting) - Source
International Test Conference 2004 (October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA). 2004 ; 1Vol, pp 95-104, 10 p ; ref : 14 ref
- ISBN
- 0-7803-8580-2
- Scientific domain
- Telecommunications
- Publisher
- IEEE, Piscataway NJ
/
International Test Conference, Washington DC
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Autotest Chronométrie Circuit synchrone Complexité circuit Essai automatique Gigue rythme Ligne retard Méthode mesure Picoseconde Registre décalage Récepteur Réseau porte programmable Taux erreur bit Temps montée Transmission donnée Valeur efficace
- Keyword (en)
- Built in self test Time measurement Synchronous circuit Circuit complexity Automatic test Timing jitter Delay line Measurement method Picosecond Shift register Receiver Field programmable gate array Bit error rate Rise time Data transmission Root mean square value
- Keyword (es)
- Autoprueba Cronometría Circuito sincrono Prueba automática Fluctuación ritmo Línea retardo Método medida Picosegundo Registro dispersión Receptor Red puerta programable Tasa error bit Tiempo subida Transmisión datos Valor eficaz
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A5 Circuits of signal characteristics conditioning (including delay circuits)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A6 Digital circuits
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18631350
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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