Rapid flaw depth estimation from SQUID-based eddy current nondestructive evaluation
- Author
- PATTABIRAMAN, M1 ; NAGENDRAN, R1 ; JANAWADKAR, M. P1
[1] Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India - Source
NDT & E international. 2007, Vol 40, Num 4, pp 289-293, 5 p ; ref : 10 ref
- ISSN
- 0963-8695
- Scientific domain
- Mechanical engineering
- Publisher
- Elsevier Science, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- 02.70.Dh SQUIDs 81.70.Ex 85.25.Dq Eddy-current testing Electromagnetic testing Finite-element analysis Nondestructive testing
- Keyword (fr)
- Dispositif SQUID Essai courant Foucault Essai magnétique Essai non destructif Essai électromagnétique Mesure électrique Modélisation Méthode élément fini Métrologie Plaque Supraconducteur haute température
- Keyword (en)
- SQUID devices Eddy current testing Magnetic testing Nondestructive testing Electromagnetic testing Electrical measurement Modelling Finite element method Metrology Plates High-Tc superconductors
- Keyword (es)
- Medida eléctrica
- Keyword (de)
- Elektrisches Messen
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11H Analysing. Testing. Standards / 001D11H02 Nondestructive testing / 001D11H02A Testing for defects
- Discipline
- Metals. Metallurgy Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18688142
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.ndteint.2006.12.003 
https://dx.doi.org/10.1016/j.ndteint.2006.12.003
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