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Characteristics of self bias voltage and poly-Si etching in pulsed helicon wave plasma

Author
KIM, J.-H1 ; KANG, C.-J1 ; AHN, T.-H1 ; MOON, J.-T1
[1] Process Development 1, Semiconductor R&D center, Samsung Electronics, Kihueng, Yongin, Kyungki, Korea, Republic of
Conference title
Papers presented at the joint symposium: The 11th Symposium on Plasma Science for Materials and the 4th Asia-Pacific Conference on Plasma Science & Technology, Coogee, Sydney, NSW, Australia, 27-29 July 1998
Conference name
Asia-Pacific Conference on Plasma Science & Technology (4 ; Coogee, Sydney 1998-07-27) = Symposium on Plasma Science for Materials (11 ; Coogee, Sydney 1998-07-27)
Author (monograph)
YOSHIDA, T (Editor)1 ; BOSWELL, R. W (Editor)2 ; KOINUMA, H (Editor)3 ; LOWKE, J. J (Editor)4
[1] The University of Tokyo, Japan
[2] Australia National University, Australia
[3] Tokyo Institute of Technology, Japan
[4] CSIRO, Australia
Source

Thin solid films. 1999, Vol 345, Num 1, pp 124-129 ; ref : 8 ref

CODEN
THSFAP
ISSN
0040-6090
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Elsevier Science, Lausanne
Publication country
Switzerland
Document type
Conference Paper
Language
English
Keyword (fr)
Cinétique Etude expérimentale Gravure plasma Gravure sélective Matériau semiconducteur Onde hélicon Pastille électronique Polycristal Silicium Source impulsionnelle Tension polarisation Traitement surface Si Non métal
Keyword (en)
Kinetics Experimental study Plasma etching Selective etching Semiconductor materials Helicon waves Wafers Polycrystals Silicon Pulsed source Bias voltage Surface treatments Nonmetals
Keyword (es)
Grabado plasma Grabado selectivo Fuente impulsional Voltage polarización
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B50 Physics of gases, plasmas and electric discharges / 001B50B Physics of plasmas and electric discharges / 001B50B77 Plasma applications

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A65 Surface treatments

Pacs
8165C Surface cleaning, etching, patterning

Discipline
Physics and materials science Physics of gases, plasmas and electric discharges
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1870391

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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