Recent results on the use of model resolution functions for the deconvolution of depth profiling data
- Author
- KOTZ, Samuel1 ; NADARAJAH, Saralees2
[1] Department of Engineering Management and Systems Engineering, George Washington University, Washington, DC 20052, United States
[2] School of Mathematics, University of Manchester, Manchester M60 1QD, United Kingdom - Source
Surface and interface analysis. 2007, Vol 39, Num 6, pp 554-555, 2 p ; ref : 11 ref
- CODEN
- SIANDQ
- ISSN
- 0142-2421
- Scientific domain
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- deconvolution double exponential resolution function initial Gaussian profile
- Keyword (fr)
- Analyse surface Déconvolution Profil profondeur
- Keyword (en)
- Surface analysis Deconvolution Depth profiles
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18720141
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/sia.2542 
https://dx.doi.org/10.1002/sia.2542
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