Reconfigurable approximate pattern matching architectures for nanotechnology
- Author
- ANNAMPEDU, Viswanath1 ; WAGH, Meghanad D2
[1] Storage Products, Agere Systems Inc, Allentown, PA 18109, United States
[2] Departtttcnt of Electrical and Computer Engineering, Lehigh University, Bethlehem, PA 18015, United States - Source
Microelectronics journal. 2007, Vol 38, Num 3, pp 430-438, 9 p ; ref : 19 ref
- ISSN
- 0959-8324
- Scientific domain
- Electronics
- Publisher
- Elsevier Science, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Error tolerance Nanotechnology Pattern matching Reconfigurable architecture Resonant tunneling diode Threshold logic
- Keyword (fr)
- Architecture reconfigurable Capteur mesure Caractéristique énergétique Concordance forme Diode effet tunnel résonnant Logique seuil Nanotechnologie Robustesse 0707D Circuit monoétage
- Keyword (en)
- Reconfigurable architectures Measurement sensor Energy characteristic Pattern matching Resonant tunneling diodes Threshold logic Nanotechnology Robustness Single stage circuit
- Keyword (es)
- Captador medida Característica energética Lógica umbral Nanotecnología Robustez
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F03 Diodes
- Discipline
- Electronics Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18725045
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.mejo.2007.01.020 
https://dx.doi.org/10.1016/j.mejo.2007.01.020
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