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Collective coherence in planar semiconductor microcavities

Author
KEELING, J1 ; MARCHETTI, F. M2 ; SZYMANSKA, M. H3 ; LITTLEWOOD, P. B1
[1] Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United Kingdom
[2] Rudolf Peierls Centre for Theoretical Physics, University of Oxford, 1 Keble Road, Oxford OX1 3NP, United Kingdom
[3] Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford OX1 3PU, United Kingdom
Source

Semiconductor science and technology. 2007, Vol 22, Num 5 ; R1-R26 ; ref : 240 ref

CODEN
SSTEET
ISSN
0268-1242
Scientific domain
Electronics; Optics; Condensed state physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Cohérence Couplage fort Dispositif planaire Effet température Exciton Microcavité Polariton Pompage optique Résonance Semiconducteur Spectre réflexion 7321
Keyword (en)
Coherence Strong coupling Planar device Temperature effects Excitons Microcavities Polaritons Optical pumping Resonance Semiconductor materials Reflection spectrum
Keyword (es)
Acoplamiento fuerte Dispositivo planar Espectro reflexión
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C21 Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18744725

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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